A Novel Model for Vulnerability Analysis through Enhanced Directed Graphs and Quantitative Metrics
The rapid evolution of industrial components, the paradigm of Industry 4.0, and the new connectivity features introduced by 5G technology all increase the likelihood of cybersecurity incidents. Such incidents are caused by the vulnerabilities present in these components. Designing a secure system is...
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https://hdl.handle.net/20.500.11984/5635 https://doi.org/10.3390/s22062126 https://katalogoa.mondragon.edu/janium-bin/janium_login_opac.pl?find&ficha_no=167549 |
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ebiltegia-20.500.11984-56352024-03-04T13:50:42Zcom_20.500.11984_473Ikerketa-Artikuluakcol_20.500.11984_478Artikuluak-Ingeniaritza A Novel Model for Vulnerability Analysis through Enhanced Directed Graphs and Quantitative Metrics Garitano, Iñaki Longueira-Romero, Angel Iglesias, Rosa Flores, José Luis CPE CVE CVSS CWE CAPEC IACS directed graph cybersecurity vulnerability assessment security metrics IEC 62443 OpenPLC The rapid evolution of industrial components, the paradigm of Industry 4.0, and the new connectivity features introduced by 5G technology all increase the likelihood of cybersecurity incidents. Such incidents are caused by the vulnerabilities present in these components. Designing a secure system is critical, but it is also complex, costly, and an extra factor to manage during the lifespan of the component. This paper presents a model to analyze the known vulnerabilities of industrial components over time. The proposed Extended Dependency Graph (EDG) model is based on two main elements: a directed graph representation of the internal structure of the component, and a set of quantitative metrics based on the Common Vulnerability Scoring System (CVSS). The EDG model can be applied throughout the entire lifespan of a device to track vulnerabilities, identify new requirements, root causes, and test cases. It also helps prioritize patching activities. The model was validated by application to the OpenPLC project. The results reveal that most of the vulnerabilities associated with OpenPLC were related to memory buffer operations and were concentrated in the libssl library. The model was able to determine new requirements and generate test cases from the analysis. Comisión Europea Gobierno de España Gobierno Vasco 2022-07-12T14:59:15Z 2022-07-12T14:59:15Z 2022 info:eu-repo/semantics/article info:eu-repo/semantics/publishedVersion https://hdl.handle.net/20.500.11984/5635 1424-8220 https://doi.org/10.3390/s22062126 https://katalogoa.mondragon.edu/janium-bin/janium_login_opac.pl?find&ficha_no=167549 eng info:eu-repo/grantAgreement/EC/H2020/957212/EU/Automated protection and prevention to meet security requirements in DevOps Enviroments/VERIDEVOPS info:eu-repo/grantAgreement/GE/Ayudas Cervera para Centros Tecnológicos CDTI/CER-20191012/ES/Red de Excelencia en Tecnologías de Seguridad y Privacidad/EGIDA info:eu-repo/grantAgreement/GV/Elkartek 2021/KK-2021-00091/CAPV/REal tiME control and embeddeD securitY/REMEDY info:eu-repo/semantics/openAccess © 2022 by the authors. Licensee MDPI Attribution 4.0 International http://creativecommons.org/licenses/by/4.0/ application/pdf MDPI Sensors .Vol. 22. N. 6. N. artículo 2126, 2022 |
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institution |
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language |
English |
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CPE CVE CVSS CWE CAPEC IACS directed graph cybersecurity vulnerability assessment security metrics IEC 62443 OpenPLC |
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CPE CVE CVSS CWE CAPEC IACS directed graph cybersecurity vulnerability assessment security metrics IEC 62443 OpenPLC Garitano, Iñaki A Novel Model for Vulnerability Analysis through Enhanced Directed Graphs and Quantitative Metrics |
description |
The rapid evolution of industrial components, the paradigm of Industry 4.0, and the new connectivity features introduced by 5G technology all increase the likelihood of cybersecurity incidents. Such incidents are caused by the vulnerabilities present in these components. Designing a secure system is critical, but it is also complex, costly, and an extra factor to manage during the lifespan of the component. This paper presents a model to analyze the known vulnerabilities of industrial components over time. The proposed Extended Dependency Graph (EDG) model is based on two main elements: a directed graph representation of the internal structure of the component, and a set of quantitative metrics based on the Common Vulnerability Scoring System (CVSS). The EDG model can be applied throughout the entire lifespan of a device to track vulnerabilities, identify new requirements, root causes, and test cases. It also helps prioritize patching activities. The model was validated by application to the OpenPLC project. The results reveal that most of the vulnerabilities associated with OpenPLC were related to memory buffer operations and were concentrated in the libssl library. The model was able to determine new requirements and generate test cases from the analysis. |
author_additional |
Longueira-Romero, Angel |
author |
Garitano, Iñaki |
title |
A Novel Model for Vulnerability Analysis through Enhanced Directed Graphs and Quantitative Metrics |
title_short |
A Novel Model for Vulnerability Analysis through Enhanced Directed Graphs and Quantitative Metrics |
title_full |
A Novel Model for Vulnerability Analysis through Enhanced Directed Graphs and Quantitative Metrics |
title_fullStr |
A Novel Model for Vulnerability Analysis through Enhanced Directed Graphs and Quantitative Metrics |
title_full_unstemmed |
A Novel Model for Vulnerability Analysis through Enhanced Directed Graphs and Quantitative Metrics |
title_sort |
novel model for vulnerability analysis through enhanced directed graphs and quantitative metrics |
publisher |
MDPI |
publishDate |
2022 |
url |
https://hdl.handle.net/20.500.11984/5635 https://doi.org/10.3390/s22062126 https://katalogoa.mondragon.edu/janium-bin/janium_login_opac.pl?find&ficha_no=167549 |
_version_ |
1792663468589973504 |